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双语推荐:电子背散射衍射

电子背散射衍射试样的制备质量对其成像效果有重要的影响。电子背散射衍射试样的制备方法已由传统的机械抛光、机械化学抛光和电解抛光发展到离子减薄、聚焦离子束和最新的截面抛光等。介绍了工业纯铁和PbTiO3微米粉末电子背散射衍射试样的制备方法。
The preparation quality of electron backscatter diffraction ( EBSD ) sample will exert a significant influence on the imaging effect .The methods of preparing EBSD sample have developed from conventional mechanical , mechanical-chemical and electrolytic polishings to ion thinning , focused ion-beam and cross section polishing .The examples of preparing EBSD samples of pure iron and micro-level PbTiO 3 powder were introduced .

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通过晶体塑性有限元与电子背散射衍射(EBSD)技术相结合的方法,实现TA15钛合金相变点以上高温压缩变形的晶体塑性有限元模拟。采用元胞自动机方法获得了晶粒的初始形貌,通过用户子程序UMAT将基于率相关晶体塑性本构方程嵌入到软件ABAQUS中。模拟结果显示,TA15合金热压缩变形组织呈明显的形变不均匀特征,模型中晶粒内部应力应变分布不均匀。不同晶粒滑移系的开动不同,即使在同一晶粒内部,也存在滑移系开动不同步的情况。采用电子背散射衍射(EBSD)技术对TA15钛合金的热压缩变形组织的变形不均匀特征进行了验证。
A crystal plasticity finite element model (CPFEM ) and the technology of EBSD have been developed to investigate the activation of the slip systems during compression of T A15 polycrystal at the temperature of 1 050℃ and the strain rate 0.01 s-1 . The constitutive equations based on rate‐dependent crystal plasticity were embedded in the software ABAQUS .The results show that , the activation of the slip system are quite different .Both strain and stress show nonuniformity in and out the grains due to the nonuniformity of the activation of the slip systems .The inhomogeneous characteristics of TA15 alloy hot deformation are ob‐served with electron backscatter diffraction (EBSD) .

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采用真空电磁搅拌电弧熔炼制备的Ni-7at%W合金初始锭,经热锻、热轧、大形变量冷轧和最终再结晶退火制备出100μm厚合金基带。采用X射线衍射(XRD)和电子背散射衍射(EBSD)研究了轧制过程中的中间退火处理对再结晶织构的影响。结果表明,提高中间退火次数可以削弱轧制织构α取向线上的取向强度,提高β取向线上的取向强度,促进轧制组织中立方取向晶核的形成,消除再结晶过程中晶粒异常长大现象,最终提高再结晶立方织构的比例。
The Ni-7at%W ingot was prepared by the vacuum arc melting with electromagnetic stirring , then the Ni-7at%W substrate with a thickness of 100 μm was fabricated by hot forging , hot rolling, cold rolling and recrystallization annealing .The effect of intermediate annealing treatment on the recrystallization texture of Ni-7at%W alloy substrate was investigated by X-ray diffraction ( XRD) and electron backscatter diffraction ( EBSD ) .The results show that the intermediate annealing treatments strengthen the intensity of β-fiber and at meantime reduce the intensity of α-fiber in the deformed alloy .Moreover , it favors the formation of cube nuclei in the rolling structure and the elimination of abnormal grain growth phenomenon during recrystallization . All of these will lead to higher volume fraction of recrystallization cube texture .

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小型化、高性能的BGA无铅器件已成为现代高集成度电子产品的组装必需器件,在其服役过程中,会经历热循环,出现失效。使用扫描电镜(SEM)、电子背散射衍射分析(EBSD)和显微硬度,对经历热循环BGA器件损伤模式进行了研究。得出结论:材料的热膨胀系数失配为裂纹萌生和扩展提供了驱动力,裂纹沿着钎料球内部弱化的局部再结晶晶界扩展,最终导致焊点断裂失效。
The compact and high-performance Lead-free BGA device has become the high integrated device which is required in electronics assembly. In the course of service, they experience thermal cycling and maybe invalid. The failure mode of BGA device, which has undergone the thermal cycling, is investigated by scanning electronic microscope, electron back scattered diffraction and micro Vickers hardness tester. It concludes that the mismatch of the coefficient of thermal expansion between materials provides the driving force for the initiation and propagation of cracks which are along the grain boundaries of the local recrystallization weakened in the solder ball, and eventually the fracture of solder joint occurs.

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航天级钛合金的新型叠层制造技术(ALM)的优势体现在较低的制造成本等方面,并可替代传统加工成型工艺。由等离子弧焊熔敷叠层制造技术制备Ti?6Al?4V合金的显微组织由定向凝固生长的β柱状晶及在其晶内生长的细小的α片层组织构成。在原位拉伸过程中结合应用高速离线电子背散射衍射表征(Offline EBSD)可快速获取试样显微组织和形变特征之间的关系。揭示出不均匀变形的发生取决于柱状晶界间的应变响应。柱状滑移和基面滑移系统被激活进而导致最后出现形变滑移线,即在某些柱状晶中滑移扩展至整个晶粒;而在另一些晶粒中表现为存在应变梯度和应力集中的地方发生形变失配。形变的扩展习性受制于定向凝固生长的柱状晶生长方向及其之间的界面取向关系。在垂直于柱状晶方向的拉伸试验揭示存在剧烈的变形局域化。基于原位拉伸观测及高速的离线电子背散射衍射表征结果,本文作者提出从微观到宏观形变扩展的控制机制。
Additive layer manufacturing (ALM) of aerospace grade titanium components shows great promise in supplying a cost-effective alternative to the conventional production routes. Complex microstructures comprised of columnar remnants of directionally solidifiedβ-grains, with interior inhabited by colonies of finerα-plate structures, were found in samples produced by layered plasma welding of Ti?6Al?4V alloy. The application of in-situ tensile tests combined with rapid offline electron backscatter diffraction (EBSD) analysis provides a powerful tool for understanding and drawing qualitative correlations between microstructural features and deformation characteristics. Non-uniform deformation occurs due to a strong variation in strain response between colonies and across columnar grain boundaries. Prismatic and basal slip systems are active, with the prismatic systems contributing to the most severe deformation through coarse and widely spaced slip lines. Certain colonies behave
通过电子背散射衍射(EBSD)和高分辨透射电子显微术(HRTEM)对缺陷闪锌矿晶体Hg3In2Te6(MIT)中的孪晶进行观察。实验发现,大多数基体的应变能比孪晶小,且一些带状孪晶的所有孪晶界均不共格。此外,高密度结构空位的存在并未改变孪生面和孪生方向。上述结果可按照变形孪晶,并考虑高密度结构空位团簇的影响来解释。HRTEM观察显示孪晶界上存在着台阶和孪生位错,符合变形孪晶的特征。
Electron backscattered diffraction (EBSD ) and high-resolution transmission electron microscopy (HRTEM)are used to study the twins in Hg3 In2 Te6 (MIT)crystals with defect zinc-blende structure.The re-sults show that strain energy of the maj ority of matrices was smaller than that of their corresponding twins.All twin boundaries of some band-like twins are incoherent.In addition,the existence of high-density structural va-cancies do not change the twinning plane and the twinning direction.The above results can be explained by de-formation twins with the consideration on the influence of high-density structural vacancy clusters.HRTEM observation shows that steps and twinning dislocations exist at the twin boundaries,which are consistent with deformation twins.

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溅射靶材的微观组织均匀性、晶粒尺寸大小及晶粒取向分布对溅射性能有着直接的影响。采用电子背散射衍射(EBSD)技术对制备的高纯Au溅射靶材不同区域的微观组织、织构组分和晶界取向差进行了研究。结果表明,高纯金靶材整体晶粒尺寸分布均匀,平均尺寸192.5nm,边沿及中心晶界取向差分布比较相似,组织均匀性良好,对溅射高质量薄膜十分有利。
The function of sputtering targets is directly affected by the homogeneity of microstructure, grain size and orientation distribution. The microstructure and texture in the different regions of high pure gold sputtering targets is analyzed by EBSD. According to studying result, the grain size and microstructure of the prepared target is uniform, average grain size is 192.5 nm. The misorientation distribution of edge and center in gold target is quite similar. All of these are beneficial for high quality sputtered film.

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对GH4698合金在室温、650及750℃的裂纹扩展行为进行研究,讨论温度对裂纹扩展寿命与速率的影响,观察不同温度下的裂纹扩展断口。采用背散射电子衍射(EBSD)技术对合金裂纹扩展的晶体学机制进行分析。结果表明,随着温度的升高,合金的裂纹扩展寿命降低,裂纹扩展速率增加,断裂模式由室温下穿晶断裂为主转变为高温下的沿晶断裂为主;裂纹附近应变程度较大,且小角度晶界密度较高。
The crack propagation behavior of GH4698 alloy was studied respectively at room temperature, 650 and 750℃. The effects of temperature on the crack propagation rate were discussed, the fractures under different temperatures were observed and the electron back scattering diffraction (EBSD) technique was applied to investigate the mechanism of crack propagation. The results show that with the increase of temperature, the fatigue life of the alloy reduces and crack propagation rate increases, and the main propagation mode of cracks changes from transgranular to intergranular. The grains near cracks have relative high deformation degree and high density, small angle grain boundaries.

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实验室模拟薄板坯连铸连轧(TSCR)流程制造高磁感取向硅钢,借助电子背散射衍射(EBSD)技术对不同Sn含量的热轧板织构进行了研究。研究结果表明:不同Sn含量热轧板表层及次表层均为高斯织构、铜型织构及黄铜织构的混合织构,中心层为{100}面织构;Sn含量为0.1%时,热轧板表层及次表层高斯织构组分最多,取向密度最大,成品磁感最高,达到1.875 T。
Texture of grain oriented silicon steel hot rolled by thin slab casting and rolling process ( TSCR ) in laboratory with different Sn contents was analyzed by electron back-scattered diffraction ( EBSD ) .The results show that the hot rolled slabs with different Sn contents have the same texture, i.e., Goss, Copper and Brass.Specifically, the texture of core layer is {100}; While the hot rolled slab with 0. 10%Sn, the surface layer and subsurface layer have a sharpness Goss texture and the finished products have a highest magnetic induction intensity which reaches 1.875 T.

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对低温加热工艺生产的以AlN为主抑制剂的高磁感取向硅钢高温退火过程进行中断实验,借助电子背散射衍射技术对高温退火过程中高斯晶粒的演变进行了研究.在升温过程中高斯晶粒平均尺寸先减小再增大.800℃时取向分布函数图出现高斯织构组分,但强度很弱,高斯晶粒偏离角在10°以上;900℃时高斯晶粒平均生长速率超过其他晶粒;950~1000℃时高斯晶粒异常长大,偏离角3°~6°;在1000℃之前高斯取向晶粒相比于其他晶粒没有尺寸优势.
The high-temperature annealing process of high permeability grain-oriented silicon steel with AlN as an inhibitor was studied by interrupting test. The evolution of Goss texture in this process was analyzed by electron back-scattered diffraction. It is found that the Goss grain size first decreases and then increases with the rise of temperature. Goss texture appears in the orientation distribu-tion function at 800℃, but the intensity is very weak and the deviation angle is more than 10o. The average growth rate of Goss grains is faster than other grains at 900℃. Goss grains grow abnormally from 950 to 1000℃, and the deviation angle ranges from 3o to 6o. Before 1000℃, in comparison with other grains, Goss grains have no size advantage.

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